| dc.contributor.author | Tripathi, R. | |
| dc.contributor.author | Bharti, Chandrahas | |
| dc.contributor.author | Kumar, A. | |
| dc.contributor.author | Sinha, Tripurari Prasad | |
| dc.date.accessioned | 2012-11-27T11:14:50Z | |
| dc.date.available | 2012-11-27T11:14:50Z | |
| dc.date.issued | 2009 | |
| dc.identifier | FOR ACCESS / DOWNLOAD PROBLEM -- PLEASE CONTACT LIBRARIAN, BOSE INSTITUTE, akc@bic.boseinst.ernet.in | en_US |
| dc.identifier.citation | Tripathi R, Bharti C, Kumar A and Sinha T P (2009) Dielectric relaxation in ZnO nanostructure, Journal of Surface Science and Technology, 25, 55-62. | en_US |
| dc.identifier.issn | 09701893 | |
| dc.identifier.uri | 1. Full Text Link -> | |
| dc.identifier.uri | ================================================= | en_US |
| dc.identifier.uri | ================================================= | en_US |
| dc.identifier.uri | 2. Scopus : Citation Link -> | en_US |
| dc.identifier.uri | http://www.scopus.com/record/display.url?eid=2-s2.0-72749091083&origin=resultslist&sort=plf-f&src=s&st1=Dielectric+relaxation+in+ZnO+nanostructure&st2=sinha%2ct.+p.&sid=8Jc_L0DLoELwCB-pLoDnGee%3a1220&sot=b&sdt=b&sl=93&s=%28TITLE-ABS-KEY-AUTH%28Dielectric+relaxation+in+ZnO+nanostructure%29+AND+AUTHOR-NAME%28sinha%2ct.+p.%29%29&relpos=1&relpos=1&searchTerm=%28TITLE-ABS-KEY-AUTH%28Dielectric%20relaxation%20in%20ZnO%20nanostructure%29%20AND%20AUTHOR-NAME%28sinha,t.%20p.%29%29# | en_US |
| dc.description.abstract | ZnO nanoparticles have been prepared in methanol through chemical technique using thioglycerol as a capping agent. Nanostructures of the prepared ZnO particles have been characterized by scanning electron microscope (SEM). The frequency-dependent dielectric dispersion of zinc oxide (ZnO) nanostructure is investigated in a frequency range from 100 Hz to 1 MHz and in the temperature range from 293 to 333 K by alternating current impedance spectroscopy (ACIS). An analysis of the complex permittivity (ε' and ε") with frequency is performed assuming a distribution of relaxation times. The frequency-dependent electrical data are analyzed in the framework of conductivity and modulus formalisms. The dielectric relaxation in ZnO nanostructures is modelled by Davidson-Cole method. The frequency dependent conductivity data are fitted to the universal power law. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier B.V | en_US |
| dc.subject | Dielectric dispersion | en_US |
| dc.subject | Impedance spectroscopy | en_US |
| dc.subject | Modulus formalism | en_US |
| dc.subject | Relaxation | en_US |
| dc.title | Dielectric relaxation in ZnO nanostructure | en_US |
| dc.title.alternative | Journal of Surface Science and Technology | en_US |
| dc.type | Article | en_US |
