Dielectric spectroscopy study of CdS nanoclusters synthesized by a soft chemical route

Abstract

Dielectric spectroscopy has been applied to investigate the electrical properties of Cadmium Sulfide (CdS) nanoclusters synthesized by a chemical reaction route using thiophenol as a capping agent. The frequency-dependent dielectric dispersion of CdS is investigated in the temperature range from 303 to 413 K and in a frequency range from SO Hz to 1 MHz. The scanning electron micrograph is taken by a FEI Quanta 200 microscope. The average grain size of the nanoclusters of CdS has been found to be 4 μm. Complex Argand plane plot of ε" against ε', usually called Cole-Cole plot is used to check the polydispersive nature of relaxation phenomena in CdS. The frequency corresponding to loss peak is found to obey an Arrhenius law with activation energy of 0.5 eV. The scaling behaviour of dielectric loss spectra suggests that the relaxation describes the same mechanism at various temperatures in CdS.