| dc.contributor.author | Tripathi, R. | |
| dc.contributor.author | Kumar, A. | |
| dc.contributor.author | Bharti, Chandrahas | |
| dc.contributor.author | Sinha, Tripurari Prasad | |
| dc.date.accessioned | 2012-11-27T12:07:57Z | |
| dc.date.available | 2012-11-27T12:07:57Z | |
| dc.date.issued | 2010-03-01 | |
| dc.identifier | FOR ACCESS / DOWNLOAD PROBLEM -- PLEASE CONTACT LIBRARIAN, BOSE INSTITUTE, akc@bic.boseinst.ernet.in | en_US |
| dc.identifier.citation | Tripathi R, Kumar A, Bharti C and Sinha T P (201 0) Dielectric relaxation of ZnO nanostructure synthesized by soft chemical method, Current Applied Physics, 10, 676-681. | en_US |
| dc.identifier.issn | 1567-1739 | |
| dc.identifier.uri | 1. Full Text Link -> | |
| dc.identifier.uri | http://www.sciencedirect.com/science/article/pii/S1567173909003976# | en_US |
| dc.identifier.uri | 2. Scopus : Citation Link -> | en_US |
| dc.identifier.uri | http://www.scopus.com/record/display.url?eid=2-s2.0-70449523324&origin=resultslist&sort=plf-f&src=s&st1=Dielectric+relaxation+of+ZnO+nanostructure+synthesized+by+soft+chemical+method&sid=8Jc_L0DLoELwCB-pLoDnGee%3a1440&sot=q&sdt=b&sl=98&s=TITLE-ABS-KEY-AUTH%28Dielectric+relaxation+of+ZnO+nanostructure+synthesized+by+soft+chemical+method%29&relpos=0&relpos=0&searchTerm=TITLE-ABS-KEY-AUTH%28Dielectric%20relaxation%20of%20ZnO%20nanostructure%20synthesized%20by%20soft%20chemical%20method%29 | en_US |
| dc.description | DOI: 10.1016/j.cap.2009.08.015 | en_US |
| dc.description.abstract | Thioglycerol capped nanoparticles of ZnO have been prepared in methanol through chemical technique. Nanostructures of the prepared ZnO particles have been confirmed through X-ray diffraction measurement. The Debye-Scherrer formula is used to obtain the particle size. The average size of the prepared ZnO nanoparticles is found to be 50 nm. The frequency-dependent dielectric dispersion of the sample is investigated in the temperature range from 293 to 383 K and in a frequency range from 100 Hz to 1 MHz by impedance spectroscopy. An analysis of the complex permittivity (epsilon' and epsilon '') and loss tangent (tan 6) with frequency is performed assuming a distribution of relaxation times. The frequency-dependent maxima of the imaginary part of impedance are found to obey Arrhenius law with activation energy similar to 1 eV. The scaling behavior of dielectric loss spectra suggests that the relaxation describes the same mechanism at various temperatures. The frequency-dependent electrical data are analyzed in the framework of conductivity and modulus formalisms. The frequency-dependent conductivity spectra obey the power law. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | ELSEVIER SCIENCE BV | en_US |
| dc.relation.uri | ================================================= | en_US |
| dc.subject | Zinc oxide | en_US |
| dc.subject | Chemical synthesis | en_US |
| dc.subject | Impedance spectroscopy | en_US |
| dc.subject | Dielectric properties | en_US |
| dc.title | Dielectric relaxation of ZnO nanostructure synthesized by soft chemical method | en_US |
| dc.title.alternative | CURRENT APPLIED PHYSICS | en_US |
| dc.type | Article | en_US |