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dc.contributor.authorTripathi, R.
dc.contributor.authorKumar, A.
dc.contributor.authorBharti, Chandrahas
dc.contributor.authorSinha, Tripurari Prasad
dc.date.accessioned2012-11-27T12:07:57Z
dc.date.available2012-11-27T12:07:57Z
dc.date.issued2010-03-01
dc.identifierFOR ACCESS / DOWNLOAD PROBLEM -- PLEASE CONTACT LIBRARIAN, BOSE INSTITUTE, akc@bic.boseinst.ernet.inen_US
dc.identifier.citationTripathi R, Kumar A, Bharti C and Sinha T P (201 0) Dielectric relaxation of ZnO nanostructure synthesized by soft chemical method, Current Applied Physics, 10, 676-681.en_US
dc.identifier.issn1567-1739
dc.identifier.uri1. Full Text Link ->
dc.identifier.urihttp://www.sciencedirect.com/science/article/pii/S1567173909003976#en_US
dc.identifier.uri2. Scopus : Citation Link ->en_US
dc.identifier.urihttp://www.scopus.com/record/display.url?eid=2-s2.0-70449523324&origin=resultslist&sort=plf-f&src=s&st1=Dielectric+relaxation+of+ZnO+nanostructure+synthesized+by+soft+chemical+method&sid=8Jc_L0DLoELwCB-pLoDnGee%3a1440&sot=q&sdt=b&sl=98&s=TITLE-ABS-KEY-AUTH%28Dielectric+relaxation+of+ZnO+nanostructure+synthesized+by+soft+chemical+method%29&relpos=0&relpos=0&searchTerm=TITLE-ABS-KEY-AUTH%28Dielectric%20relaxation%20of%20ZnO%20nanostructure%20synthesized%20by%20soft%20chemical%20method%29en_US
dc.descriptionDOI: 10.1016/j.cap.2009.08.015en_US
dc.description.abstractThioglycerol capped nanoparticles of ZnO have been prepared in methanol through chemical technique. Nanostructures of the prepared ZnO particles have been confirmed through X-ray diffraction measurement. The Debye-Scherrer formula is used to obtain the particle size. The average size of the prepared ZnO nanoparticles is found to be 50 nm. The frequency-dependent dielectric dispersion of the sample is investigated in the temperature range from 293 to 383 K and in a frequency range from 100 Hz to 1 MHz by impedance spectroscopy. An analysis of the complex permittivity (epsilon' and epsilon '') and loss tangent (tan 6) with frequency is performed assuming a distribution of relaxation times. The frequency-dependent maxima of the imaginary part of impedance are found to obey Arrhenius law with activation energy similar to 1 eV. The scaling behavior of dielectric loss spectra suggests that the relaxation describes the same mechanism at various temperatures. The frequency-dependent electrical data are analyzed in the framework of conductivity and modulus formalisms. The frequency-dependent conductivity spectra obey the power law.en_US
dc.language.isoenen_US
dc.publisherELSEVIER SCIENCE BVen_US
dc.relation.uri=================================================en_US
dc.subjectZinc oxideen_US
dc.subjectChemical synthesisen_US
dc.subjectImpedance spectroscopyen_US
dc.subjectDielectric propertiesen_US
dc.titleDielectric relaxation of ZnO nanostructure synthesized by soft chemical methoden_US
dc.title.alternativeCURRENT APPLIED PHYSICSen_US
dc.typeArticleen_US


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