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dc.contributor.authorBasu, B.
dc.contributor.authorDey, S.
dc.contributor.authorMaulik, A.
dc.contributor.authorRaha, Sibaji
dc.contributor.authorSaha, S.
dc.contributor.authorSaha, Swapan K.
dc.contributor.authorSyam, Debapriyo
dc.date.accessioned2012-12-03T07:30:02Z
dc.date.available2012-12-03T07:30:02Z
dc.date.issued2009-04-01
dc.identifierFOR ACCESS / DOWNLOAD PROBLEM -- PLEASE CONTACT LIBRARIAN, BOSE INSTITUTE, akc@bic.boseinst.ernet.inen_US
dc.identifier.citationBasu B, Dey S, Maulik A, Raha S, Saha S, Saha S K, Syam D (2009) Determination of the depth of an etch pit through studies of diffraction rings. Rad. Meas., 44, 359-362.en_US
dc.identifier.issn1350-4487
dc.identifier.uri1. Full Text Link ->
dc.identifier.urihttp://www.sciencedirect.com/science/article/pii/S1350448709000626#en_US
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dc.identifier.uri2. Scopus : Citation Link ->en_US
dc.identifier.urihttp://www.scopus.com/record/display.url?eid=2-s2.0-68049147282&origin=resultslist&sort=plf-f&src=s&st1=Determination+of+the+depth+of+an+etch+pit+through+studies+of+diffraction+rings&st2=raha%2cs&sid=C5FED4059220165A37B568E5C97C4FAC.Vdktg6RVtMfaQJ4pNTCQ%3a20&sot=b&sdt=b&sl=119&s=%28TITLE-ABS-KEY%28Determination+of+the+depth+of+an+etch+pit+through+studies+of+diffraction+rings%29+AND+AUTHOR-NAME%28raha%2cs%29%29&relpos=0&relpos=0&searchTerm=%28TITLE-ABS-KEY%28Determination+of+the+depth+of+an+etch+pit+through+studies+of+diffraction+rings%29+AND+AUTHOR-NAME%28raha%2Cs%29%29en_US
dc.descriptionDOI: 10.1016/j.radmeas.2009.03.021en_US
dc.description.abstractA Solid State Nuclear Track Detector (SSNTD) can be used to identify an impinging ion as well as to determine the energy of that ion. The track of the ion is made visible by chemically 'etching' the detector after exposure. By finding out the ratio of the track-etch rate (V(t)) to the bulk-etch rate (V(g)), together with the range of the ion in the detector, the identity and the energy of the ion can be ascertained. The required measurements can be conveniently made with the help of a microscope when the angle of incidence of the ion, with respect to the normal direction to the detector surface, is more than 15 degrees. For normal or near normal incidence. uncertainties plague the measurement of the depth of the etch pit and hence the range of the particle. Through this article we wish to suggest an alternative method of assessment, based on the observation of diffraction rings, of the depth of an etch pit.en_US
dc.description.sponsorshipDepartment of Science and Technology (DST), Govt. of India, New Delhi IR/S2/PF-01/2003en_US
dc.language.isoenen_US
dc.publisherPERGAMON-ELSEVIER SCIENCE LTDen_US
dc.subjectSSNTDen_US
dc.subjectEtch pitsen_US
dc.subjectDiffraction ringsen_US
dc.titleDetermination of the depth of an etch pit through studies of diffraction ringsen_US
dc.title.alternativeRADIATION MEASUREMENTSen_US
dc.typeArticleen_US


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