| dc.contributor.author | Agrawal, Lata | |
| dc.contributor.author | Dutta, Alo | |
| dc.contributor.author | Sinha, Tripurari Prasad | |
| dc.date.accessioned | 2012-12-04T05:15:50Z | |
| dc.date.available | 2012-12-04T05:15:50Z | |
| dc.date.issued | 2009 | |
| dc.identifier | FOR ACCESS / DOWNLOAD PROBLEM -- PLEASE CONTACT LIBRARIAN, BOSE INSTITUTE, akc@bic.boseinst.ernet.in | en_US |
| dc.identifier.citation | Agrawal L, Dutta A and Sinha T P (2009) Dielectric relaxation in ln(Mg0 . 5Ti0 .5)03 nanoceramic, Journal of Surface science and Technology, 25, 85-94. | en_US |
| dc.identifier.issn | 09701893 | |
| dc.identifier.uri | 1. Full Text Link -> | |
| dc.identifier.uri | ================================================= | en_US |
| dc.identifier.uri | 2. Scopus : Citation Link -> | en_US |
| dc.identifier.uri | http://www.scopus.com/record/display.url?eid=2-s2.0-72749104204&origin=resultslist&sort=plf-f&src=s&st1=Dielectric+relaxation+in&st2=sinha%2ct.+p.&nlo=&nlr=&nls=&sid=778E45FC6435D3C796F10C8ADAFF839D.iqs8TDG0Wy6BURhzD3nFA%3a510&sot=b&sdt=b&sl=75&s=%28TITLE-ABS-KEY-AUTH%28Dielectric+relaxation+in%29+AND+AUTHOR-NAME%28sinha%2ct.+p.%29%29&relpos=40&relpos=0&searchTerm=%28TITLE-ABS-KEY-AUTH%28Dielectric+relaxation+in%29+AND+AUTHOR-NAME%28sinha%2Ct.+p.%29%29# | en_US |
| dc.description.abstract | The complex perovskite oxide indium magnesium titanate, In(Mg 1/2Ti 1/2)O 3 (IMT) is synthesized by a solid stale reaction technique. Impedance spectroscopy is applied to investigate the electrical properties of IMT in a temperature range from 143 to 333 K and in a frequency range from 580 Hz to 1 MHz. The X-ray diffraction of the sample at room temperature (30 °C) shows monoclinic phase. The average crystalline size of the IMT powder, calculated using Scherrer's equation is ∼ 110 nm. An analysis of the dielectric constant of ε and loss tangent (tan δ) with frequency is performed assuming a distribution of relaxation times. The frequencydependent electrical data are analyzed in the framework of conductivity formalism. The frequency dependent conductivity data are fitted to the universal power law. All these formalisms provided for qualitative similarities in the relaxation time. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier B.V. | en_US |
| dc.subject | Ceramics | en_US |
| dc.subject | Dielectric properties | en_US |
| dc.subject | Impedance spectroscopy | en_US |
| dc.subject | Solid-state reaction | en_US |
| dc.title | Dielectric relaxation in In(Mg 0.5Ti 0.5)O 3 nanoceramic | en_US |
| dc.title.alternative | Journal of Surface Science and Technology | en_US |
| dc.type | Article | en_US |
