Show simple item record

dc.contributor.authorDutta, Alo
dc.contributor.authorBharti, Chandrahas
dc.contributor.authorSinha, Tripurari Prasad
dc.date.accessioned2013-02-13T09:27:15Z
dc.date.available2013-02-13T09:27:15Z
dc.date.issued2008-10-01
dc.identifierFOR ACCESS / DOWNLOAD PROBLEM -- PLEASE CONTACT LIBRARIAN, BOSE INSTITUTE, akc@bic.boseinst.ernet.inen_US
dc.identifier.citationDutta Alo, Bharti Chandrahas and Sinha T P (2008) Dielectric relaxation in SrMg113Nb21303", Physica B, 403, 3389-3393.en_US
dc.identifier.issn0921-4526
dc.identifier.uri1.Full Text Link ->
dc.identifier.urihttp://ac.els-cdn.com/S092145260800207X/1-s2.0-S092145260800207X-main.pdf?_tid=ef847b74-75bf-11e2-ac4f-00000aacb361&acdnat=1360747979_9507af8144a5473a6ca802f91f2fc1e9en_US
dc.identifier.uri=================================================en_US
dc.identifier.uri2.Scopus : Citation Link ->en_US
dc.identifier.urihttp://www.scopus.com/record/display.url?eid=2-s2.0-55349103012&origin=resultslist&sort=plf-f&src=s&st1=Dielectric+relaxation+in+Sr&st2=sinha%2ct.+p.&sid=DF5A73F2A678475F026BC47E33DA60FB.N5T5nM1aaTEF8rE6yKCR3A%3a20&sot=b&sdt=b&sl=73&s=%28TITLE-ABS-KEY%28Dielectric+relaxation+in+Sr%29+AND+AUTHOR-NAME%28sinha%2ct.+p.%29%29&relpos=9&relpos=9&searchTerm=%28TITLE-ABS-KEY%28Dielectric+relaxation+in+Sr%29+AND+AUTHOR-NAME%28sinha%2Ct.+p.%29%29en_US
dc.descriptionDOI: 10.1016/j.physb.2008.04.042en_US
dc.description.abstractThe frequency-dependent dielectric dispersion of strontium-magnesium-niobate (SMN), Sr(Mg1/3Nb2/3)O-3 ceramic synthesized by the solid state reaction technique is investigated in the temperature range from 303 to 613 K The X-ray diffraction of the sample at room temperature (30 degrees C) shows monoclinic phase. The scanning electron micrograph of the sample shows the average grain size of SMN similar to 1 mu m. The frequency-dependent electrical data are also analyzed in the framework of the conductivity formalism. An analysis of the electric modulus and impedance with frequency is performed in the entire temperature range. The frequency-dependent maxima in the imaginary part of electric modulus are found to obey an Arrhenius law with activation energy similar to 1.8 eV. Such a value of activation energy suggests the existence of a relaxation mechanism (a conductive process), which may be interpreted by an ion hopping between neighbouring sites within the crystalline lattice. Results indicate that the relaxation mechanism of the material is temperature dependent and has dominated bulk contribution in different temperature ranges. The Cole-Cole approach is used to explain the relaxation mechanism in SMN. The scaling behaviour of imaginary part of electric modulus and imaginary impedance suggests that the relaxation describes the same mechanism at various temperatures.en_US
dc.language.isoenen_US
dc.publisherELSEVIER SCIENCE BVen_US
dc.subjectPerovskite oxidesen_US
dc.subjectDielectric relaxationen_US
dc.subjectImpedance spectroscopyen_US
dc.titleDielectric relaxation in Sr(Mg1/3Nb2/3)O-3en_US
dc.title.alternativePHYSICA B-CONDENSED MATTERen_US
dc.typeArticleen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record